News Archives: April 2017

Focused Ion Beam-Scanning Electron Microscopy

With any kind of work, it helps to be able to see what you’re doing, but that can be a challenge when working at microscopic scales or below. By taking advantage of a system that combines two separate instruments – a focused ion beam (FIB) and a scanning electron microscope (SEM) –...
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Atom Probe Tomography

  Atom probe tomography (APT) offers the enticing prospect of being able to determine the identity and position of nearly every atom in a material, providing the ultimate in elemental analysis. The technique involves applying either ultra-fast voltage pulses or laser pulses to a...
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